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Publication - Nature Scientific Reports - High-resolution quantitative determination of dielectric function by using s-SNOM
Submitted by Lanir Contact Point on Fri, 07/03/2015 - 11:34
Abstract
A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine.
More information at : http://dx.doi.org/10.1038/srep11876